EE Times

NewSpace-Grade NOR Flash: Right-Sized Reliability for Space Missions

This paper first examines how total ionizing dose and single-event effects degrade NOR Flash. It focuses on the charge pumps, sense amplifiers, and control logic that often fail before the storage array does. It then presents a method for deriving radiation requirements from four mission inputs (orbit, lifetime, shielding, and risk tolerance) instead of applying […] The post NewSpace-Grade NOR Flash: Right-Sized Reliability for Space Missions appeared first on EE Times. ]]>

By EE Times

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NewSpace-Grade NOR Flash: Right-Sized Reliability for Space Missions
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